Jesus Anguiano

Agilent Webinar Series Part 3

Analysis of Electronic and Special Gases Using GC-ICP-MS

Jesus Anguiano (Consolidated Sciences)

Thursday, March 17, 2022 | 2PM EDT | Online

Summary

People are always surprised when told that their computer chips start out as gases. Typically, the chips are made in tools by sequential introduction of various gases and with use of chemical vapor deposition (CVD). Moore’s law to this point has been based on many factors not the least of which been the purity of the gases used in each step of the manufacturing process. GC-ICP-MS is an important tool in assuring the purity of these gases by measuring the impurities at low ppb and even ppt levels. Most of these gases are either toxic, pyrophoric, or corrosive. Thus strategies of presentation as well as chromatographic analyses of a number of these gases is discussed.

About the Author

Jesus AnguianoJesus is a Senior Chemist with over a decade of experience in research and development, specialized applications, and instrumental analysis at CONSCI. CONSCI is a leading provider of analytical services for specialty gases. Jesus often presents interesting technical material at conferences like PITTCON and GCC. Jesus has also contributed to numerous presentations, app notes, and white papers involving gas chromatography, and mass spectrometry. In addition, he co-authored ‘Appendix A: Materials of Construction’ for the book Trace Analysis of Specialty and Electronic Gases.

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About the Author

Jesus is a Senior Chemist with over a decade of experience in research and development, specialized applications, and instrumental analysis at CONSCI. CONSCI is a leading provider of analytical services for specialty gases. Jesus often presents interesting technical material at conferences like PITTCON and GCC. Jesus has also contributed to numerous presentations, app notes, and white papers involving gas chromatography, and mass spectrometry. In addition, he co-authored ‘Appendix A: Materials of Construction’ for the book Trace Analysis of Specialty and Electronic Gases.

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About Consolidated Sciences

Consolidated Sciences (CONSCI) is a leading provider of independent specialty gas testing services. Although we specialize in not-so-routine analyses, we have almost three decades of experience in everything from advanced R&D projects to routine quality tests. At CONSCI, we like to say ‘We do the hard stuff!’ because some of our best work has been done when everyone else said it couldn’t be done.

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About the Agilent Webinar Series:

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Additional Publications from CONSCI

[1] 

Geiger, Bill, & Anguiano, Jesus. (2022, March). Analysis of Electronic and Special Gases Using GC-ICP-MS [Webinar]. Agilent Webinar Series: I wish I knew about that sooner! https://event.on24.com/wcc/r/3584135/E80A20CC599D9678B38E044494CEDD8A

[2] 

Geiger, Bill. (2022, March). GC/ICP-MS: Strategies And Techniques Using ICP-MS As A Gas Chromatographic Detector [Webinar]. Agilent Webinar Series: I wish I knew about that sooner! https://event.on24.com/wcc/r/3584134/A3DE567C9CA57179D72046E8EF5F64D9

[3] 

McElmurry, Blake, & Geiger, Bill. (2022, February). Analysis of Petroleum and Petrochemicals Using GC-ICP-MS [Webinar]. Agilent Webinar Series: I wish I knew about that sooner! https://event.on24.com/wcc/r/3571313/AB690F9ACC208C4051BE51B776911A74

[4] 

Geiger, William M., McElmurry, B., Anguiano, J., & Kelinske, M. (2022, January). Strategies in Tuning for Gas Phase Metalloids as Analytes in GC-ICPMS. Poster presented at the 47th Winter Conference on Plasma Spectrochemistry. Tucson, AZ.

[5] 

Geiger, William M., Anguiano, Jesus, & McElmurry, Blake. (2021, October). Analysis of Ethylene and Acetylene Impurities Using A Single Column Set and GC-ICP QQQ ORS. Poster presented at the Gulf Coast Conference. Galveston, TX.

[6] 

Geiger, William M. (2020, November). GC-ICP-MS Methods Applied to Petroleum and Petrochemical Products. Poster presentation at Agilent's Virtual Energy and Chemical Summit.

[7] 

Geiger, William M., McElmurry, Blake, Anguiano, Jesus, & Kelinske, Mark. (2020, September). Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ. Agilent Technologies Application Note, 5994-2213EN.

[8] 

Geiger, William M., McElmurry, Blake, Anguiano, Jesus, & Kelinske, Mark. (2020, October). GC-ICP-QQQ Method to Measure Trace Contaminants in Arsine Gas Used for III-V Compound Semiconductors. Agilent ICP-MS Journal. 2-3.

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